EE 252

Course ID:

Course Code & Number

EE 252

Course Title

Microelectronic Devices and Circuits

Level

BS

Credit Hours/ ECTS Credits

(3+0+0) 3 TEDU Credits, 5 ECTS Credits

Year of Study:

Sophomore

Semester:

Spring

Type of Course:

Compulsory

Mode of Delivery:

Face-to-face

Language of Instruction:

English

Pre-requisite / Co-requisite::

Catalog Description

Basic semiconductor fundamentals. The current mechanisms in semiconductors: drift and diffusion currents. The formation and operation principle of the p-n junction diode. Breakdown mechanism in p-n junction diode. Half-wave rectifier and peak detector circuits. The operation principle of bipolar junction transistor (BJT) and metal-oxide-semiconductor field-effect transistor (MOSFET) at direct current (DC). MOSFET as an amplifier.

Course Objectives

This course equips students with the operational knowledge of semiconductor components like p-n junction diodes, bipolar junction transistors (BJTs), and metal oxide semiconductor field effect transistors (MOSFETs). The course also enables students to grasp circuit operations involving diodes and transistors, like rectifiers, detectors, and amplifiers, alongside DC analysis for BJTs and MOSFETs.

Software Usage

MATLAB and LTspice®

Course Learning Outcomes

Upon successful completion of the course, students will be able to:
(1) Recognize the basic semiconductor fundamentals, including free carrier generation and doping,
(2) Classify diffusion and drift currents, comprehending their principles and behaviors,
(3) Apply knowledge to evaluate p-n junction diode formation, understanding operational principles and breakdown mechanism,
(4) Analyze BJT and MOSFET operation principles, functionalities, and characteristics,
(5) Evaluate BJT- and MOSFET-based circuits at DC for performance and behavior,
(6) Create new ways to modify MOSFET usage as an amplifier.

Learning Activities and Teaching Methods:

Telling/Explaining Questioning Reading Problem Solving Collaborating Think-Pair-Share Brainstorming Web Searching

Assessment Methods and Criteria:

Test / Exam Quiz Others

Assessment Methods and Criteria Others:

Active Learning Exercises

Design Content

Recommended Reading

(1) Sedra, S., & Smith, K. C. (2009). Microelectronic Circuits (6th ed.). Oxford University Press.
(2) Pierret, R. F. (1996). Semiconductor Device Fundamentals. Addison-Wesley.

Required Reading

Jaeger, R. C., & Blalock, T. N. (2008). Microelectronic Circuit Design. McGraw Hill.

Grading

Test/Exam (75%), Active Learning Exercises (15%), Quiz (10%)

Learning Activities and Teaching Methods Others:

Course Coordinator:

Çiçek Boztuğ Yerci

Student Workload:

Workload	Hrs
Lectures	42
Course Readings	45
Exams/Quizzes	47
Active Learning Exercises	16

Course & Program Learning Outcome Matching: